B. Cretu

Low-Frequency Noise Analysis and Modeling in Vertical Tunnel FETs With Ge Source

F. S. Neves, Paula Ghedini Der Agopian, João Antônio Martino et al. · IEEE Transactions on Electron Devices · 2016 · 119 citations

New method for parameter extraction in deep submicrometer MOSFETs

C. Mourrain, B. Cretu, G. Ghibaudo et al. · 2002 · 43 citations

Device Modeling, Electrical Engineering, Engineering +9

Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors

I. Lartigau, Jean‐Marc Routoure, Wei Guo et al. · Journal of Applied Physics · 2007 · 42 citations · Full text

Semiconductor Technology, Electrical Engineering, Engineering +13

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

Sara Dereste dos Santos, B. Cretu, V. Strobel et al. · Solid-State Electronics · 2014 · 36 citations

Electrical Engineering, Engineering, Rf Semiconductor +8

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ $\hbox{HfO}_{2}$ Gate Stack

Weiming Guo, G. Nicholas, B. Kaczer et al. · IEEE Electron Device Letters · 2007 · 36 citations

Semiconductor Technology, Gate Stack, Electrical Engineering +12