Publication | Closed Access
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics
36
Citations
35
References
2014
Year
Electrical EngineeringEngineeringRf SemiconductorHigh-frequency DeviceElectronic EngineeringBias Temperature InstabilityNoiseDifferent Gate DielectricsMicroelectronicsLow-frequency Noise AssessmentElectromagnetic Compatibility
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