An XPS study of GaN thin films on GaAs

R. Carin, J.P. Deville, J. Werckmann

Surface and Interface Analysis

SemiconductorsWide-bandgap SemiconductorElectrical EngineeringEngineeringOptoelectronic Materials +11

Determination of high-density interface state parameters in metal-insulator-semiconductor structures by deep-level transient spectroscopy

Franck Murray, R. Carin, P. Bogdanski

Journal of Applied Physics

Categoryquantum ElectronicsEngineeringHigh DensitiesMetal-insulator-semiconductor StructuresSemiconductor Device +14

Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors

I. Lartigau, Jean‐Marc Routoure, Wei Guo, +5

Journal of Applied Physics

Semiconductor TechnologyElectrical EngineeringEngineeringPhysicsBias Temperature Instability +11

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

Sara Dereste dos Santos, B. Cretu, V. Strobel, +7

Solid-State Electronics

Electrical EngineeringEngineeringRf SemiconductorHigh-frequency DeviceElectronic Engineering +6

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ $\hbox{HfO}_{2}$ Gate Stack

Weiming Guo, G. Nicholas, B. Kaczer, +8

IEEE Electron Device Letters

Semiconductor TechnologyGate StackElectrical EngineeringGermanium SurfaceEngineering +10

DC and low frequency noise performances of SOI p-FinFETs at very low temperature

H. Achour, Rachida Talmat, B. Cretu, +7

Solid-State Electronics

Electrical EngineeringEngineeringRf SemiconductorNanoelectronicsElectronic Engineering +6

Low frequency noise characterization in n-channel FinFETs

Rachida Talmat, H. Achour, B. Cretu, +7

Solid-State Electronics

Electrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityNoise +4

Experimental study by “in situ” resistivity measurements of swift heavy ion induced defects in GaAs crystals

M. Mikou, R. Carin, P. Bogdanski, +1

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms

Semiconductor TechnologyGaas CrystalsEngineeringPhysicsCrystalline Defects +7

Low frequency noise assessment in n- and p-channel sub-10nm triple-gate FinFETs: Part I: Theory and methodology

D. Boudier, B. Cretu, Eddy Simoen, +4

Solid-State Electronics

Electrical EngineeringEngineeringNanoelectronicsElectronic EngineeringBias Temperature Instability +4

Current crowding and 1/f noise in polycrystalline silicon thin film transistors

A. Mercha, L.K.J. Vandamme, Laurent Pichon, +2

Journal of Applied Physics

Device ModelingElectrical EngineeringEngineeringPhysicsCorner Frequency +9