R. Carin

An XPS study of GaN thin films on GaAs

R. Carin, J.P. Deville, J. Werckmann · Surface and Interface Analysis · 1990 · 112 citations

Semiconductors, Wide-bandgap Semiconductor, Electrical Engineering +13

Determination of high-density interface state parameters in metal-insulator-semiconductor structures by deep-level transient spectroscopy

Franck Murray, R. Carin, P. Bogdanski · Journal of Applied Physics · 1986 · 52 citations

Categoryquantum Electronics, Engineering, High Densities +16

Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors

I. Lartigau, Jean‐Marc Routoure, Wei Guo et al. · Journal of Applied Physics · 2007 · 42 citations · Full text

Semiconductor Technology, Electrical Engineering, Engineering +13

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

Sara Dereste dos Santos, B. Cretu, V. Strobel et al. · Solid-State Electronics · 2014 · 36 citations

Electrical Engineering, Engineering, Rf Semiconductor +8

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ $\hbox{HfO}_{2}$ Gate Stack

Weiming Guo, G. Nicholas, B. Kaczer et al. · IEEE Electron Device Letters · 2007 · 36 citations

Semiconductor Technology, Gate Stack, Electrical Engineering +12