Jean‐Marc Routoure

Author

Jean‐Marc Routoure

Also Known As

Carin, Régis, J M Routoure, J-M Routoure, J-M. Routoure, J. M. Routoure, J. Routoure, J.-M Routoure, J.-M. Routoure, J.M Routoure, J.M. Routoure

138

Publications

743

Citations

H-Index

Concepts

All Affiliations

GREYC École Nationale Supérieure d'Ingénieurs de Caen Centre National de la Recherche Scientifique Université de Caen Normandie KU Leuven

About

Jean‐Marc Routoure is an author at GREYC specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	24	532
2	Electrical Engineering	15	20	456
3	Applied Physics	14	20	432
4	Education	1	1	31
5	Natural Sciences	1	1	12

Jean‐Marc Routoure

Publications

608

Citations

H-Index

Page 1

	Year	Citations
Experimental technique for reducing contact and background noise in voltage spectral density measurements C. Barone, Alice Galdi, S. Pagano, Review of Scientific Instruments	2007	47
Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors I. Lartigau, Jean‐Marc Routoure, Wei Guo, Journal of Applied Physics Semiconductor TechnologyElectrical EngineeringEngineeringPhysicsBias Temperature Instability	2007	42
Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics Sara Dereste dos Santos, B. Cretu, V. Strobel, Solid-State Electronics Electrical EngineeringEngineeringRf SemiconductorHigh-frequency DeviceElectronic Engineering	2014	36
Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ $\hbox{HfO}_{2}$ Gate Stack Weiming Guo, G. Nicholas, B. Kaczer, IEEE Electron Device Letters Semiconductor TechnologyGate StackElectrical EngineeringGermanium SurfaceEngineering	2007	36
DC and low frequency noise performances of SOI p-FinFETs at very low temperature H. Achour, Rachida Talmat, B. Cretu, Solid-State Electronics Electrical EngineeringEngineeringRf SemiconductorNanoelectronicsElectronic Engineering	2013	32
Low frequency noise characterization in n-channel FinFETs Rachida Talmat, H. Achour, B. Cretu, Solid-State Electronics Electrical EngineeringEngineeringNanoelectronicsBias Temperature InstabilityNoise	2011	32
A Low-Noise and Quasi-Ideal DC Current Source Dedicated to Four-Probe Low-Frequency Noise Measurements Jean‐Marc Routoure, Sheng Wu, C. Barone, IEEE Transactions on Instrumentation and Measurement Electrical EngineeringEngineeringPhysicsMeasurementCorner Frequency	2019	31
1 ∕ f noise in patterned La2∕3Sr1∕3MnO3 thin films in the 300–400K range Laurence Méchin, Jean‐Marc Routoure, Silvana Mercone, Journal of Applied Physics Materials ScienceDetailed InvestigationsElectrical EngineeringMaterial AnalysisEngineering	2008	29
La0.7Sr0.3MnO3 suspended microbridges for uncooled bolometers made using reactive ion etching of the silicon substrates S. Liu, Bruno Guillet, Amar Aryan, Microelectronic Engineering Materials EngineeringUncooled BolometersElectrical EngineeringEngineeringMicrofabrication	2013	28
Apparent volume dependence of 1∕f noise in thin film structures: Role of contacts C. Barone, S. Pagano, Laurence Méchin, Review of Scientific Instruments Engineering Noise ControlEngineeringLa0.7sr0.3mno3 Thin FilmsApparent Volume DependenceNoise	2008	27

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