Jean‐Marc Routoure

Experimental technique for reducing contact and background noise in voltage spectral density measurements

C. Barone, Alice Galdi, S. Pagano et al. · Review of Scientific Instruments · 2007 · 47 citations

Low temperature noise spectroscopy of 0.1 μm partially depleted silicon on insulator metal-oxide-semiconductor field effect transistors

I. Lartigau, Jean‐Marc Routoure, Wei Guo et al. · Journal of Applied Physics · 2007 · 42 citations · Full text

Semiconductor Technology, Electrical Engineering, Engineering +13

Low-frequency noise assessment in advanced UTBOX SOI nMOSFETs with different gate dielectrics

Sara Dereste dos Santos, B. Cretu, V. Strobel et al. · Solid-State Electronics · 2014 · 36 citations

Electrical Engineering, Engineering, Rf Semiconductor +8

Low-Frequency Noise Assessment of Silicon Passivated Ge pMOSFETs With TiN/TaN/ $\hbox{HfO}_{2}$ Gate Stack

Weiming Guo, G. Nicholas, B. Kaczer et al. · IEEE Electron Device Letters · 2007 · 36 citations

Semiconductor Technology, Gate Stack, Electrical Engineering +12

DC and low frequency noise performances of SOI p-FinFETs at very low temperature

H. Achour, Rachida Talmat, B. Cretu et al. · Solid-State Electronics · 2013 · 32 citations · Full text

Electrical Engineering, Engineering, Rf Semiconductor +8