Alexander Olbrich

Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

Alexander Olbrich, B. Ebersberger, Christian Boit · Applied Physics Letters · 1998 · 167 citations

Atomic Force Microscopy, Engineering, Afm Tip +21

Electrical characterization of stressed and broken down SiO2 films at a nanometer scale using a conductive atomic force microscope

M. Porti, M. Nafrı́a, X. Aymerich et al. · Journal of Applied Physics · 2002 · 112 citations

Engineering, Silicon On Insulator, Sio2 Films +25

The tunneling field effect transistor (TFET) as an add-on for ultra-low-voltage analog and digital processes

T. Nirschl, Pengzhan Wang, C. E. Webe et al. · 2005 · 70 citations

Electrical Engineering, Engineering, Vlsi Design +11

High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy

Alexander Olbrich, B. Ebersberger, Christian Boit et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 50 citations

Electrical Probes, Engineering, Microscopy +21

The origin of the integral barrier height in inhomogeneous Au/Co/GaAs67P33-Schottky contacts: A ballistic electron emission microscopy study

Alexander Olbrich, J. Vancea, Franz Kreupl et al. · Journal of Applied Physics · 1998 · 49 citations

Engineering, Electron Diffraction, Semiconductor Device +19