Concepedia

B. Ebersberger

BE

Statistics

Publications

13

Citations

622

H-Index

12

Active since

1994

Affiliations

Infineon Technologies (Germany)(Current)

Siemens (Germany)

Universitat Autònoma de Barcelona

Singapore Science Park

Agency for Science, Technology and Research

B. Ebersberger is an author at Infineon Technologies (Germany) specializing in materials science, electronic materials, and atomic force microscopy.

Publications per year

1994–2008

13

Publications

13

Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

Alexander Olbrich, B. Ebersberger, Christian Boit · Applied Physics Letters · 1998 · 167 citations

, , +17

Electrical characterization of stressed and broken down SiO2 films at a nanometer scale using a conductive atomic force microscope

M. Porti, M. Nafrı́a, X. Aymerich et al. · Journal of Applied Physics · 2002 · 112 citations

, , +17

Cu pillar bumps as a lead-free drop-in replacement for solder-bumped, flip-chip interconnects

B. Ebersberger, Charles Lee · 2008 · 51 citations

, , +16

High aspect ratio all diamond tips formed by focused ion beam for conducting atomic force microscopy

Alexander Olbrich, B. Ebersberger, Christian Boit et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 50 citations

, , +17

Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

M. Porti, M. Nafrı́a, X. Aymerich et al. · Applied Physics Letters · 2001 · 48 citations · Full text

, , +17

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