Michael W. McCurdy

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

T. D. Loveless, S. Jagannathan, Trey Reece et al. · IEEE Transactions on Nuclear Science · 2011 · 123 citations

Engineering, Dice Designs, Neutron Scattering +16

Proton-Induced Dehydrogenation of Defects in AlGaN/GaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Cher Xuan Zhang et al. · IEEE Transactions on Nuclear Science · 2013 · 109 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13

Effects of Applied Bias and High Field Stress on the Radiation Response of GaN/AlGaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Rong Jiang et al. · IEEE Transactions on Nuclear Science · 2015 · 104 citations

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +12

The Impact of X-Ray and Proton Irradiation on ${\rm HfO}_2/{\rm Hf}$-Based Bipolar Resistive Memories

Jinshun Bi, Zhengzhi Han, En Xia Zhang et al. · IEEE Transactions on Nuclear Science · 2013 · 101 citations

\Rm Hf, Engineering, Radiation Materials Science +20

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 74 citations

Low-power Electronics, Hardware Security, Electrical Engineering +13