Michael W. McCurdy

Neutron- and Proton-Induced Single Event Upsets for D- and DICE-Flip/Flop Designs at a 40 nm Technology Node

T. D. Loveless, S. Jagannathan, Trey Reece et al. · IEEE Transactions on Nuclear Science · 2011 · 125 citations

Engineering, Computer Engineering, Electrical Engineering +17

Proton-Induced Dehydrogenation of Defects in AlGaN/GaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Cher Xuan Zhang et al. · IEEE Transactions on Nuclear Science · 2013 · 111 citations

Engineering, Materials Engineering, Materials Science +17

Effects of Applied Bias and High Field Stress on the Radiation Response of GaN/AlGaN HEMTs

Jin Chen, Yevgeniy Puzyrev, Rong Jiang et al. · IEEE Transactions on Nuclear Science · 2015 · 108 citations

Medicine, Electrical Engineering, Materials Science +17

The Impact of X-Ray and Proton Irradiation on ${\rm HfO}_2/{\rm Hf}$-Based Bipolar Resistive Memories

Jinshun Bi, Zhengzhi Han, En Xia Zhang et al. · IEEE Transactions on Nuclear Science · 2013 · 103 citations

Medicine, Materials Engineering, Materials Science +17

Mitigation Techniques for Single-Event-Induced Charge Sharing in a 90-nm Bulk CMOS Process

Oluwole A. Amusan, L. W. Massengill, M.P. Baze et al. · IEEE Transactions on Device and Materials Reliability · 2009 · 75 citations

Engineering, Computer Engineering, Electrical Engineering +12