Daniel Kwang Guan Chan

EUROM-A Spoken Language Resource for the EU

Daniel Kwang Guan Chan, Adrian Fourcin, Daffyd Gibbon et al. · Conference of the International Speech Communication Association · 1995 · 104 citations

Applied Linguistics, Language Documentation, Speech Corpus +8

Degraded CMOS hot carrier life time-role of plasma etching induced charging damage and edge damage

Xiaoyu Li, Tomasz Brożek, P. Aum et al. · 1995 · 20 citations

Edge Damage, Hc Lifetime, Electrical Engineering +13

Reappearance of plasma induced oxide charge underFowler-Nordheim stress

X. Li, Jen-Tai Hsu, P. Aum et al. · Electronics Letters · 1994 · 19 citations

Nickel Salicided Source/Drain Extensions for Performance Improvement in Ultrascaled (Sub 10 nm) Si-Nanowire Transistors

Yu Jiang, T. Y. Liow, Navab Singh et al. · IEEE Electron Device Letters · 2009 · 17 citations

Gaa Nw Process, Semiconductor Technology, Electrical Engineering +15

Effect of plasma poly etch on effective channel length and hot carrier reliability in submicron transistors

Xiaoyu Li, R. Divakaruni, Jen-Tai Hsu et al. · IEEE Electron Device Letters · 1994 · 14 citations

Engineering, Plasma Electronics, Plasma Theory +18