Concepedia

Tomasz Brożek

TB

Statistics

Publications

13

Citations

196

H-Index

11

Active since

1991

Affiliations

University of California, Los Angeles(Current)

Warsaw University of Technology

Motorola (United States)

Rockwell Automation (United States)

Tomasz Brożek is an author at University of California, Los Angeles specializing in engineering, electrical engineering, and microelectronics.

Top concepts

EngineeringElectrical EngineeringApplied PhysicsMicroelectronicsNanoelectronicsPhysicsElectronic PackagingElectrical InsulationCharge TransportMaterial Science

Publications per year

1991–2002

13

Publications

13

Evaluation of plasma damage using fully processed metal–oxide–semiconductor transistors

Xiaoyu Li, Tomasz Brożek, F. N. Preuninger et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1996 · 27 citations

Semiconductor Technology, Electrical Engineering, Plasma Electronics +11

Generation of hole traps in thin silicon oxide layers under high-field electron injection

Tomasz Brożek, C.R. Viswanathan · Applied Physics Letters · 1996 · 23 citations

Electrical Engineering, High-field Electron Injection, Engineering +13

Degraded CMOS hot carrier life time-role of plasma etching induced charging damage and edge damage

Xiaoyu Li, Tomasz Brożek, P. Aum et al. · 1995 · 20 citations

Edge Damage, Hc Lifetime, Electrical Engineering +13

Electrical behaviour and breakdown in plasma deposited cubic BN layers

Tomasz Brożek, J. Szmidt, A. Jakubowski et al. · Diamond and Related Materials · 1994 · 18 citations

Electrical Engineering, Engineering, Physics +6

Hole trap generation in the gate oxide due to plasma-induced charging

Tomasz Brożek, Y.D. Chan, C.R. Viswanathan · IEEE Electron Device Letters · 1996 · 14 citations

Engineering, Hole Traps, Charge Transport +16

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