Concepedia

Jen-Tai Hsu

JH

Statistics

Publications

3

Citations

63

H-Index

3

Active since

1993

Affiliations

University of California, Los Angeles(Current)

Jen-Tai Hsu is an author at University of California, Los Angeles specializing in semiconductor devices, physics, and electrical engineering.

Publications per year

1993–1994

3

Publications

3

Plasma-damaged oxide reliability study correlating both hot-carrier injection and time-dependent dielectric breakdown

Xiang Li, Jen-Tai Hsu, P. Aum et al. · IEEE Electron Device Letters · 1993 · 30 citations

, , +17

Reappearance of plasma induced oxide charge underFowler-Nordheim stress

X. Li, Jen-Tai Hsu, P. Aum et al. · Electronics Letters · 1994 · 19 citations

, , +16

Effect of plasma poly etch on effective channel length and hot carrier reliability in submicron transistors

Xiaoyu Li, R. Divakaruni, Jen-Tai Hsu et al. · IEEE Electron Device Letters · 1994 · 14 citations

, , +15

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