J.E. Oristian

Velocity saturation effect on short-channel MOS transistor capacitance

H. Iwai, M.R. Pinto, C.S. Rafferty et al. · IEEE Electron Device Letters · 1985 · 23 citations

Engineering, Electrical Engineering, Electronic Materials +16

Analysis of Velocity Saturation and Other Effects on Short-Channel MOS Transistor Capacitances

Hiroshi Iwai, M.R. Pinto, C.S. Rafferty et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1987 · 22 citations

Engineering, Electrical Engineering, Microelectronics +16

A scaleable technique for the measurement of intrinsic MOS capacitance with atto-Farad resolution

Hiroshi Iwai, J.E. Oristian, J.T.S. Walker et al. · IEEE Transactions on Electron Devices · 1985 · 21 citations

Engineering, Electrical Engineering, Circuit Theory +16

Small Geometry MOS Transistor Measurements and Observed Short and Narrow Channel Effects

H. Iwai, J.E. Oristian, J.T.S. Walker et al. · Symposium on VLSI Technology · 1984 · 11 citations

Engineering, Electrical Engineering, Electronic Materials +15