Concepedia

Small Geometry MOS Transistor Measurements and Observed Short and Narrow Channel Effects

H. Iwai, J.E. Oristian, J.T.S. Walker, R.W. Dutton

Symposium on VLSI Technology · 1984 · 11 citations · 0 references

Concepts

EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesDevice CharacterizationDevice ModelingDevice ScalingField-effect TransistorsMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsChannel Length ScalingCmos ScalingMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingShort-channel Mobility DegradationShort-channel Scaling TheorySource-drain Leakage