Un Ki Kim

Effect of high-pressure oxygen annealing on negative bias illumination stress-induced instability of InGaZnO thin film transistors

Kwang Hwan Ji, Ji-In Kim, Hong Yoon Jung et al. · Applied Physics Letters · 2011 · 297 citations

Engineering, Electrical Engineering, Materials Science +17

Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment

Shinhyuk Yang, Kwang Hwan Ji, Un Ki Kim et al. · Applied Physics Letters · 2011 · 96 citations

Engineering, Electrical Engineering, Physics +17

Correlation of the change in transfer characteristics with the interfacial trap densities of amorphous In–Ga–Zn–O thin film transistors under light illumination

Jeong Hwan Kim, Un Ki Kim, Yoon Jang Chung et al. · Applied Physics Letters · 2011 · 64 citations

Engineering, Electrical Engineering, Materials Science +17

Improvement in Photo-Bias Stability of High-Mobility Indium Zinc Oxide Thin-Film Transistors by Oxygen High-Pressure Annealing

Se Yeob Park, Cheol Seong Hwang, Hyeong Joon Kim et al. · IEEE Electron Device Letters · 2013 · 63 citations

Engineering, Electrical Engineering, Materials Science +17

Spectroscopic investigation of the hole states in Ni-deficient NiO films

Deok‐Yong Cho, Seul Ji Song, Un Ki Kim et al. · Journal of Materials Chemistry C · 2013 · 60 citations

Natural Sciences, Chemistry, Materials Science +17