Shinhyuk Yang

Photon-accelerated negative bias instability involving subgap states creation in amorphous In–Ga–Zn–O thin film transistor

Himchan Oh, Sung‐Min Yoon, Min Ki Ryu et al. · Applied Physics Letters · 2010 · 346 citations

Wide-bandgap Semiconductor, Engineering, Optoelectronic Devices +17

Transparent and Photo‐stable ZnO Thin‐film Transistors to Drive an Active Matrix Organic‐Light‐ Emitting‐Diode Display Panel

Sang‐Hee K. Park, Chi‐Sun Hwang, Min‐Ki Ryu et al. · Advanced Materials · 2008 · 336 citations · Full text

Bottom Emission Mode, Electrical Engineering, Engineering +13

An ‘aqueous route’ for the fabrication of low-temperature-processable oxide flexible transparent thin-film transistors on plastic substrates

Young Hwan Hwang, Jin-Suk Seo, Je Moon Yun et al. · NPG Asia Materials · 2013 · 233 citations · Full text

Engineering, Post Annealing, Optoelectronic Devices +21

Comparative Study on Light-Induced Bias Stress Instability of IGZO Transistors With $\hbox{SiN}_{x}$ and $ \hbox{SiO}_{2}$ Gate Dielectrics

Kwang Hwan Ji, Yeon‐Gon Mo, Jong Han Jeong et al. · IEEE Electron Device Letters · 2010 · 181 citations

Thin-film Transistor, Engineering, Igzo Transistors +16

Improvement in the photon-induced bias stability of Al–Sn–Zn–In–O thin film transistors by adopting AlOx passivation layer

Shinhyuk Yang, Doo‐Hee Cho, Min Ki Ryu et al. · Applied Physics Letters · 2010 · 153 citations

Semiconductor Technology, Electrical Engineering, Electronic Devices +15