Hong Yoon Jung

Effect of high-pressure oxygen annealing on negative bias illumination stress-induced instability of InGaZnO thin film transistors

Kwang Hwan Ji, Ji-In Kim, Hong Yoon Jung et al. · Applied Physics Letters · 2011 · 297 citations

Engineering, Electrical Engineering, Materials Science +17

Origin of the improved mobility and photo-bias stability in a double-channel metal oxide transistor

Hong Yoon Jung, Youngho Kang, Ah Young Hwang et al. · Scientific Reports · 2014 · 130 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +17

Role of incorporated hydrogen on performance and photo-bias instability of indium gallium zinc oxide thin film transistors

Hyo Jin Kim, Se Yeob Park, Hong Yoon Jung et al. · Journal of Physics D Applied Physics · 2012 · 81 citations

Engineering, Electrical Engineering, Materials Science +17

Improvement in both mobility and bias stability of ZnSnO transistors by inserting ultra-thin InSnO layer at the gate insulator/channel interface

Ji-In Kim, Kwang Hwan Ji, Hong Yoon Jung et al. · Applied Physics Letters · 2011 · 80 citations

Engineering, Electrical Engineering, Materials Science +17

The Effect of Density-of-State on the Temperature and Gate Bias-Induced Instability of InGaZnO Thin Film Transistors

Kwang Hwan Ji, Ji-In Kim, Hong Yoon Jung et al. · Journal of The Electrochemical Society · 2010 · 61 citations

Engineering, Electrical Engineering, Materials Science +17