Patrick R. Fleming

Charge Collection and Charge Sharing in a 130 nm CMOS Technology

Oluwole A. Amusan, Arthur F. Witulski, L. W. Massengill et al. · IEEE Transactions on Nuclear Science · 2006 · 394 citations

Low-power Electronics, Hardware Security, Electrical Engineering +14

Directional Sensitivity of Single Event Upsets in 90 nm CMOS Due to Charge Sharing

Oluwole A. Amusan, Lloyd W. Massengill, M.P. Baze et al. · IEEE Transactions on Nuclear Science · 2007 · 92 citations

Engineering, Nm Cmos Due, Dice Latch +17

Routine Chest Radiography Is Not Necessary After Ultrasound-Guided Right Internal Jugular Vein Catheterization

Justin J. Hourmozdi, Abraham Markin, Brad Johnson et al. · Critical Care Medicine · 2016 · 40 citations

Increased Rate of Multiple-Bit Upset From Neutrons at Large Angles of Incidence

Alan D. Tipton, Xiao‐Wei Zhu, Haixiao Weng et al. · IEEE Transactions on Device and Materials Reliability · 2008 · 32 citations

Engineering, Nuclear Physics, Large Angles +21

Effects of Random Dopant Fluctuations (RDF) on the Single Event Vulnerability of 90 and 65 nm CMOS Technologies

A. Balasubramanian, Patrick R. Fleming, B. L. Bhuva et al. · IEEE Transactions on Nuclear Science · 2007 · 28 citations

Random Dopant Fluctuations, Engineering, Vlsi Design +19