Young June Park

80nm self-aligned complementary I-MOS using double sidewall spacer and elevated drain structure and its applicability to amplifiers with high linearity

Woo Young Choi, Jae Young Song, Byung Yong Choi et al. · 2004 · 21 citations

Engineering, Electrical Engineering, Analog Electronics +16

Analytical noise model with the influence of shot noise induced by the gate leakage current for submicrometer gate-length high-electron-mobility transistors

Doo-Sik Shin, J.B. Lee, Hong Shick Min et al. · IEEE Transactions on Electron Devices · 1997 · 17 citations

Engineering, Electrical Engineering, Microelectronics +16

Quantum simulation of noise in silicon nanowire transistors with electron-phonon interactions

Hong-Hyun Park, Seonghoon Jin, Young June Park et al. · Journal of Applied Physics · 2009 · 12 citations

Engineering, Electrical Engineering, Physics +17

Modeling of retention time distribution of DRAM cell using a Monte-Carlo method

Sconghoon Jin, Jcong-Hyong Yi, Jac Hoon Choi et al. · 2005 · 12 citations

Engineering, Electrical Engineering, Materials Science +17