Statistics
Publications
1
Citations
17
H-Index
1
Active since
1997
Affiliations
Samsung (South Korea)(Current)
Doo-Sik Shin is an author at Samsung (South Korea) specializing in gate leakage current, high-electron-mobility transistors, and shot noise analysis.
Publications per year
1997–1997
1
1
Doo-Sik Shin, J.B. Lee, Hong Shick Min et al. · IEEE Transactions on Electron Devices · 1997 · 17 citations
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