A. Ermolieff - Concepedia

Author

A. Ermolieff

Commissariat à l'Énergie Atomique et aux Énergies Alternatives

Also Known As

A ERMOLIEFF, A Ermolieff, A. Ermolieff, Anne ERMOLIEFF, Anne Ermolieff

Publications

844

Citations

H-Index

Concepts

All Affiliations

Commissariat à l'Énergie Atomique et aux Énergies Alternatives CEA Grenoble Laboratoire d'Électronique des Technologies de l'Information Direction de la Recherche Technologique Centre National de la Recherche Scientifique

About

A. Ermolieff is an author at Commissariat à l'Énergie Atomique et aux Énergies Alternatives specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	15	19	765
2	Applied Physics	13	16	661
3	Chemistry	7	7	199
4	Chemical Engineering	5	5	112
5	Natural Sciences	2	2	55

A. Ermolieff

Publications

765

Citations

H-Index

Page 1

	Year	Citations
Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O L.G. Gosset, J.-F. Damlencourt, O. Renault, Journal of Non-Crystalline Solids Materials ScienceAluminium NitrideMaterial AnalysisEngineeringMaterial Characterization	2002	125
Angle-resolved x-ray photoelectron spectroscopy of ultrathin Al2O3 films grown by atomic layer deposition O. Renault, L.G. Gosset, D. Rouchon, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films Materials ScienceOxide HeterostructuresUltrathin Al2o3 FilmsAl2o3 LayersEngineering	2002	116
High-temperature ion beam synthesis of cubic SiC B. Daudin, M. Dupuy, A. Ermolieff, Journal of Applied Physics Materials EngineeringMaterials ScienceHigh-dose Carbon ImplantationIon ImplantationEngineering	1990	77
XPS, Raman spectroscopy, X‐ray diffraction, specular X‐ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization A. Ermolieff, Amal Chabli, F. Pierre, Surface and Interface Analysis X-ray SpectroscopyEngineeringElectronic PropertiesSpectroscopic PropertyCarbon-based Material	2001	65
Electroluminescence from n+ -type porous silicon contacted with layer-by-layer deposited polyaniline A. Bsiesy, Y.F. Nicolau, A. Ermolieff, Thin Solid Films Materials ScienceConducting PolymerEngineeringSemiconducting PolymerOrganic Electronics	1995	58
Thermal aging of undoped polyaniline: Effect of chemical degradation on electrical properties Yannick Kieffel, Jean Pierre Travers, A. Ermolieff, Journal of Applied Polymer Science EngineeringDegradation ReactionOrganic ChemistryChemistryPolymers	2002	47
Nitridation of Si (100) made by radio frequency plasma as studied by <i>i</i> <i>n</i> <i>s</i> <i>i</i> <i>t</i> <i>u</i> angular resolved x-ray photoelectron spectroscopy A. Ermolieff, Pascal Bernard, S. Marthon, Journal of Applied Physics X-ray SpectroscopyEngineeringPhysicsVariable Takeoff AnglesNatural Sciences	1986	41
Nitridation of polycrystalline titanium as studied by <i>in situ</i> angle‐resolved x‐ray photoelectron spectroscopy A. Ermolieff, Pascal Bernard, S. Marthon, Surface and Interface Analysis X-ray SpectroscopyEngineeringAbstract NitridationSolid-state ChemistryPolycrystalline Titanium	1988	36
An XPS comparative study on thermal oxide barrier formation on Nb and NbN thin films A. Ermolieff, Maxime Girard, C. Raoul, Applications of Surface Science Materials ScienceEngineeringThermal Barrier CoatingOxide ElectronicsApplied Physics	1985	31
X-ray spectroscopy of the oxidation of 6H-SiC(0001) Laurent Simon, L. K�ubler, A. Ermolieff, Physical review. B, Condensed matter Materials EngineeringOxide HeterostructuresChemical EngineeringMaterials ScienceX-ray Spectroscopy	1999	24

Page 1