A. Ermolieff

Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O

L.G. Gosset, J.-F. Damlencourt, O. Renault et al. · Journal of Non-Crystalline Solids · 2002 · 125 citations

Materials Science, Aluminium Nitride, Material Analysis +7

Angle-resolved x-ray photoelectron spectroscopy of ultrathin Al2O3 films grown by atomic layer deposition

O. Renault, L.G. Gosset, D. Rouchon et al. · Journal of Vacuum Science & Technology A Vacuum Surfaces and Films · 2002 · 116 citations

Materials Science, Oxide Heterostructures, Ultrathin Al2o3 Films +14

High-temperature ion beam synthesis of cubic SiC

B. Daudin, M. Dupuy, A. Ermolieff et al. · Journal of Applied Physics · 1990 · 77 citations

Materials Engineering, Materials Science, High-dose Carbon Implantation +11

XPS, Raman spectroscopy, X‐ray diffraction, specular X‐ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization

A. Ermolieff, Amal Chabli, F. Pierre et al. · Surface and Interface Analysis · 2001 · 65 citations

X-ray Spectroscopy, Engineering, Electronic Properties +16

Electroluminescence from n+ -type porous silicon contacted with layer-by-layer deposited polyaniline

A. Bsiesy, Y.F. Nicolau, A. Ermolieff et al. · Thin Solid Films · 1995 · 58 citations

Materials Science, Conducting Polymer, Engineering +7