F. Pierre

XPS, Raman spectroscopy, X‐ray diffraction, specular X‐ray reflectivity, transmission electron microscopy and elastic recoil detection analysis of emissive carbon film characterization

A. Ermolieff, Amal Chabli, F. Pierre et al. · Surface and Interface Analysis · 2001 · 66 citations

Natural Sciences, Materials Engineering, Materials Science +13

N-doped GeTe as performance booster for embedded Phase-Change Memories

A. Fantini, V. Sousa, L. Perniola et al. · 2010 · 54 citations

Natural Sciences, Materials Engineering, Materials Science +10

Magnetic and structural properties of rf-sputtered Co/Fe and Co/Cr multilayers

Ph. Houdy, Pierre Boher, F. Girón et al. · Journal of Applied Physics · 1991 · 45 citations

Natural Sciences, Materials Science, Physics +17

Tb/Fe multilayers: A study by conversion electron Mössbauer spectrometry and polar Kerr effect

A. Fnidiki, F. Richomme, J. Teillet et al. · Journal of Magnetism and Magnetic Materials · 1993 · 29 citations

Natural Sciences, Materials Science, Physics +13

Nonmagnetic thin layers of Ni3N

D. Vempaire, F. Fettar, L. Ortéga et al. · Journal of Applied Physics · 2009 · 28 citations

Natural Sciences, Materials Engineering, Materials Science +17