S.J. Mathew

A total resistance slope-based effective channel mobility extraction method for deep submicrometer CMOS technology

Guofu Niu, John D. Cressler, S.J. Mathew et al. · IEEE Transactions on Electron Devices · 1999 · 81 citations

Low-power Electronics, Electrical Engineering, Mobility Extraction +9

Total dose effects on the shallow-trench isolation leakage current characteristics in a 0.35 /spl mu/m SiGe BiCMOS technology

Guofu Niu, S.J. Mathew, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 1999 · 42 citations

Sti Leakage, Electrical Engineering, Semiconductor Device +11

A comparison of the effects of gamma irradiation on SiGe HBT and GaAs HBT technologies

S. Zhang, Guofu Niu, John D. Cressler et al. · IEEE Transactions on Nuclear Science · 2000 · 30 citations

Electrical Engineering, Semiconductor Device, Engineering +13

A channel resistance derivative method for effective channel length extraction in LDD MOSFETs

Guofu Niu, John D. Cressler, S.J. Mathew et al. · IEEE Transactions on Electron Devices · 2000 · 25 citations

Electrical Engineering, Clear Graphic Image, Engineering +6

High–performance, low–power, and leakage–tolerance challenges for sub–70nm microprocessor circuits

Ram Krishnamurthy, Atila Alvandpour, S.J. Mathew et al. · European Solid-State Circuits Conference · 2002 · 19 citations

Low-power Electronics, Hardware Security, Electrical Engineering +15