K. Asano - Concepedia

Author

K. Asano

Kansai Electric Power (Japan)ORCID

Also Known As

F. Emori, K. ASANO, K. Asano, Keiichiro Asano, Kenshi Asano, Koichiro Asano, T Matsuo

102

Publications

1.4K

Citations

H-Index

Concepts

All Affiliations

Kansai Electric Power (Japan)NEC (Japan)Kyoto University Central Research Institute of Electric Power Industry National Institute of Advanced Industrial Science and Technology

About

K. Asano is an author at Kansai Electric Power (Japan) specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	20	35	1.2K
2	Applied Physics	12	13	593
3	Medicine	1	1	18
4	Biochemistry	1	1	18
5	Biomolecular Engineering	1	1	13

K. Asano

Publications

1.2K

Citations

H-Index

Page 1

	Year	Citations
High channel mobility in inversion layers of 4H-SiC MOSFETs by utilizing (112~0) face Hiroshi Yano, T. Hirao, Tsunenobu Kimoto, IEEE Electron Device Letters Semiconductor TechnologyElectrical Engineering4H-sic MosfetsEngineeringInversion Channel Mobility	1999	211
12-19 kV 4H-SiC pin diodes with low power loss Y. Sugawara, Daisuke Takayama, K. Asano, Electrical EngineeringSwitching LossEngineeringLow Power LossHigh Voltage Engineering	2002	110
Novel high power AlGaAs/GaAs HFET with a field-modulating plate operated at 35 V drain voltage K. Asano, Yosuke Miyoshi, K. Ishikura, Field-modulating PlateElectrical EngineeringEngineeringFabricated FetsNanoelectronics	2002	66
Degradation mechanism of molten carbonate fuel cell based on long-term performance: Long-term operation by using bench-scale cell and post-test analysis of the cell Hiroshi Morita, Makoto Kawase, Yoshihiro Mugikura, Journal of Power Sources Chemical EngineeringEngineeringEnergy ConversionGasificationBench-scale Cell	2010	59
Long-wavelength PINFET receiver OEIC on a GaAs-on-InP heterostructure Akira Suzuki, Tetsuji Itoh, T. Terakado, Electronics Letters PhotonicsElectrical EngineeringLong-wavelength Pinfet OeicEngineeringRf Semiconductor	1987	55
Recent Achievements of NEDO Durability Project with an Emphasis on Correlation Between Cathode Overpotential and Ohmic Loss Harumi Yokokawa, Yuichi Hori, T. Shigehisa, Fuel Cells EngineeringElectrode-electrolyte InterfaceNedo Durability ProjectConductivity DegradationYsz Electrolyte	2017	49
Enhancement and control of carrier lifetimes in p-type 4H-SiC epilayers Toshihiko Hayashi, K. Asano, Jun Suda, Journal of Applied Physics Materials EngineeringMaterials ScienceElectrical EngineeringSemiconductor TechnologyEngineering	2012	46
Achievements of NEDO Durability Projects on SOFC Stacks in the Light of Physicochemical Mechanisms Harumi Yokokawa, M. Suzuki, Masakazu Yoda, Fuel Cells Materials EngineeringMaterials ScienceChemical EngineeringEngineeringElectrode-electrolyte Interface	2019	41
Temperature and injection level dependencies and impact of thermal oxidation on carrier lifetimes in p-type and n-type 4H–SiC epilayers Toshihiko Hayashi, K. Asano, Jun Suda, Journal of Applied Physics EngineeringThermal OxidationCarrier LifetimeSemiconductor DeviceSemiconductors	2011	40
Impacts of reduction of deep levels and surface passivation on carrier lifetimes in <i>p</i>-type 4H-SiC epilayers Toshihiko Hayashi, K. Asano, Jun Suda, Journal of Applied Physics SemiconductorsMaterials ScienceElectrical EngineeringElectronic DevicesDeep Levels	2011	31

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