Concepedia

Nilufa Rahim

NR

Statistics

Publications

3

Citations

56

H-Index

3

Active since

2006

Affiliations

New Jersey Institute of Technology(Current)

Nilufa Rahim is an author at New Jersey Institute of Technology specializing in microelectronics, applied physics, and engineering.

Top concepts

Publications per year

2006–2009

3

Publications

3

Interface characterization of high-k dielectrics on Ge substrates

D. Misra, Reenu Garg, P. Srinivasan et al. · Materials Science in Semiconductor Processing · 2006 · 24 citations

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Temperature dependent time-to-breakdown (TBD) of TiN/HfO2 n-channel MOS devices in inversion

N. A. Chowdhury, X. Wang, Gennadi Bersuker et al. · Microelectronics Reliability · 2009 · 16 citations

, , +5

Temperature Effects on Breakdown Characteristics of High-$\kappa$ Gate Dielectrics With Metal Gates

Nilufa Rahim, D. Misra · IEEE Transactions on Device and Materials Reliability · 2008 · 16 citations

, , +14

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