Reenu Garg

Charge trapping and interface characteristics of thermally evaporated HfO2

N. A. Chowdhury, Reenu Garg, D. Misra · Applied Physics Letters · 2004 · 33 citations

Hafnium Oxide, Electrical Engineering, Charge Trapping +10

Interface characterization of high-k dielectrics on Ge substrates

D. Misra, Reenu Garg, P. Srinivasan et al. · Materials Science in Semiconductor Processing · 2006 · 24 citations

Engineering, Applied Physics, Interface Characterization +5

Electrical Characteristics of Thermally Evaporated HfO[sub 2]

Reenu Garg, N. A. Chowdhury, Madhu Bhaskaran et al. · Journal of The Electrochemical Society · 2004 · 18 citations · Full text

Engineering, Thin Film Process Technology, Electrical Characteristics +19

Ge MOS Capacitors with Thermally Evaporated HfO[sub 2] as Gate Dielectric

Reenu Garg, D. Misra, P.K. Swain · Journal of The Electrochemical Society · 2006 · 15 citations

Materials Science, Electrical Engineering, Germanium Substrates +15

Suppression of substrate coupling in GaN high electron mobility transistors (HEMTs) by hole injection from the p-GaN gate

Dario Pagnano, Giorgia Longobardi, Florin Udrea et al. · Applied Physics Letters · 2019 · 15 citations · Full text

Wide-bandgap Semiconductor, Electrical Engineering, Engineering +13