L.R. Hite

Characteristics and three-dimensional integration of MOSFET's in small-grain LPCVD polycrystalline Silicon

S.D.S. Malhi, H. Shichijo, S. Banerjee et al. · IEEE Transactions on Electron Devices · 1985 · 190 citations

Engineering, Vlsi Design, Computer Architecture +17

Time-dependent hole and electron trapping effects in SIMOX buried oxides

H. E. Boesch, Thomas L. Taylor, L.R. Hite et al. · IEEE Transactions on Nuclear Science · 1990 · 87 citations

Electrical Engineering, Simox Fets, Engineering +14

Transient Radiation Effects in SOI Memories

G. E. Davis, L.R. Hite, T.G.W. Blake et al. · IEEE Transactions on Nuclear Science · 1985 · 75 citations

Electrical Engineering, Transient Radiation Effects, Engineering +13

Model for CMOS/SOI single-event vulnerability

S.E. Kerns, L. W. Massengill, D.V. Kerns et al. · IEEE Transactions on Nuclear Science · 1989 · 65 citations

Event-driven Architecture, Engineering, Vlsi Design +19

Titanium nitride local interconnect technology for VLSI

T.E. Tang, C.C. Wei, R.A. Haken et al. · IEEE Transactions on Electron Devices · 1987 · 44 citations

Engineering, Vlsi Design, Integrated Circuits +17