G. Cibrario

3DVLSI with CoolCube process: An alternative path to scaling

P. Batude, C. Fenouillet-Béranger, L. Pasini et al. · 2015 · 134 citations

Engineering, Vlsi Design, Computer Architecture +23

Fundamental variability limits of filament-based RRAM

Alessandro Grossi, E. Nowak, Cristian Zambelli et al. · 2016 · 132 citations

Non-volatile Memory, Electrical Engineering, Resistive Ram +13

Planar Fully depleted SOI technology: A powerful architecture for the 20nm node and beyond

O. Faynot, F. Andrieu, O. Weber et al. · 2010 · 104 citations

Engineering, Vlsi Design, Computer Architecture +18

Low leakage and low variability Ultra-Thin Body and Buried Oxide (UT2B) SOI technology for 20nm low power CMOS and beyond

F. Andrieu, O. Weber, J. Mazurier et al. · 2010 · 103 citations

Engineering, Vlsi Design, Integrated Circuits +16

3D sequential integration opportunities and technology optimization

P. Batude, B. Sklénard, C. Fenouillet-Béranger et al. · 2014 · 58 citations