Multilevel HfO2-based RRAM devices for low-power neuromorphic networks

Valerio Milo, Cristian Zambelli, P. Olivo, +5

APL Materials

EngineeringRram DevicesPhase Change MemoryNeurochipSocial Sciences +14

Fundamental variability limits of filament-based RRAM

Alessandro Grossi, E. Nowak, Cristian Zambelli, +8

Non-volatile MemoryElectrical EngineeringResistive RamEngineeringFlash Memory +11

Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits

Valerio Milo, Artem Glukhov, Eduardo Pérez, +7

IEEE Transactions on Electron Devices

Artificial IntelligenceElectrical EngineeringEngineeringHardware AccelerationNeural Network +13

Experimental Investigation of 4-kb RRAM Arrays Programming Conditions Suitable for TCAM

Alessandro Grossi, Elisa Vianello, Cristian Zambelli, +6

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Hardware SecurityNon-volatile MemoryElectrical EngineeringMemory ArchitectureEngineering +13

Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention

Eduardo Pérez, Cristian Zambelli, Mamathamba Kalishettyhalli Mahadevaiah, +2

IEEE Journal of the Electron Devices Society

Non-volatile MemoryEngineeringEmerging Memory TechnologyComputer ArchitectureReliable Multi-level Operation +18

Resistive RAM Endurance: Array-Level Characterization and Correction Techniques Targeting Deep Learning Applications

Alessandro Grossi, Elisa Vianello, Mohamed M. Sabry, +10

IEEE Transactions on Electron Devices

Hardware SecurityElectrical EngineeringResistive RamEngineeringResistive Ram Endurance +12

Architectural and Integration Options for 3D NAND Flash Memories

Rino Micheloni, Luca Crippa, Cristian Zambelli, +1

Computers

Planar NandElectrical EngineeringNand Flash TechnologyEngineeringNand Flash Memories +13

Reduction of the Cell-to-Cell Variability in Hf_1-xAl_xO_yBased RRAM Arrays by Using Program Algorithms

Eduardo Pérez, Alessandro Grossi, Cristian Zambelli, +3

IEEE Electron Device Letters

EngineeringMemory DesignEmerging Memory TechnologyComputer ArchitectureComputer Memory +20

Impact of Intercell and Intracell Variability on Forming and Switching Parameters in RRAM Arrays

Alessandro Grossi, Damian Walczyk, Cristian Zambelli, +12

IEEE Transactions on Electron Devices

EngineeringPulse FormingIntegrated CircuitsPhase Change MemoryInitial State +14

Electrical characterization and modeling of pulse-based forming techniques in RRAM arrays

Alessandro Grossi, Cristian Zambelli, P. Olivo, +4

Solid-State Electronics

Electrical EngineeringEngineeringEmerging Memory TechnologyApplied PhysicsElectrical Characterization +3