M. Bohr

A 90-nm logic technology featuring strained-silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Transactions on Electron Devices · 2004 · 654 citations

Electrical Engineering, Engineering, Nanoelectronics +10

A 90nm high volume manufacturing logic technology featuring novel 45nm gate length strained silicon CMOS transistors

T. Ghani, M Armstrong, C. Auth et al. · 2004 · 559 citations

Silicon Cmos Transistors, Engineering, High Volume +17

Interconnect scaling-the real limiter to high performance ULSI

M. Bohr · 2002 · 546 citations

Hardware Security, Electrical Engineering, Engineering +15

A Logic Nanotechnology Featuring Strained-Silicon

Scott E. Thompson, M Armstrong, C. Auth et al. · IEEE Electron Device Letters · 2004 · 511 citations

Electrical Engineering, Engineering, Flexible Electronics +12

The High-k Solution

M. Bohr, R. Chau, T. Ghani et al. · IEEE Spectrum · 2007 · 375 citations

Mathematical Programming, Numerical Analysis, Engineering +21