Hervé Deslandes

Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors

J. Zhang, Nina Boiadjieva, G. Chulkova et al. · Electronics Letters · 2003 · 63 citations

Near-infrared Photon Emission, Photonics, Electrical Engineering +15

Non-destructive defect depth determination at fully packaged and stacked die devices using Lock-in Thermography

Christian Schmidt, Frank Altmann, Rudolf Schlangen et al. · 2010 · 38 citations

Engineering, Measurement, Education +21

A new estimate of the quadrupole moment of the sun

J. R�sch, Jean-Pierre Rozelot, Hervé Deslandes et al. · Solar Physics · 1996 · 23 citations

Physics, Natural Sciences, Celestial Mechanic +5

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization

Rudolf Schlangen, Hervé Deslandes, Ted Lundquist et al. · Microelectronics Reliability · 2010 · 20 citations

Fault Diagnosis, Reliability Engineering, Engineering +7

Next-Generation Optical Probing Tools for Design Debug of High Speed Integrated Circuits

William Lo, K. Wilsher, Richard Malinsky et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2002 · 14 citations

Photonic Sensor, Engineering, Optical Testing +21