Laser Voltage Imaging: A New Perspective of Laser Voltage Probing

Yin S. Ng, Ted Lundquist, Dmitry Skvortsov, +3

Proceedings - International Symposium for Testing and Failure Analysis

EngineeringMicroscopyOptical DiagnosticsFailure Analysis RealmOptical Testing +7

Fault localization using time resolved photon emission and stil waveforms

Nagamani Nataraj, Ted Lundquist, Ketan Shah

EngineeringMeasurementDiagnosisEducationReliability Engineering +20

Physical Techniques for Chip-Backside IC Debug in Nanotechnologies

Christian Boit, Rudolf Schlangen, U. Kerst, +1

IEEE Design & Test of Computers

EngineeringConstant InnovationsHardware SecurityPhysical Design (Electronics)Reliability Engineering +20

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization

Rudolf Schlangen, Hervé Deslandes, Ted Lundquist, +5

Microelectronics Reliability

Fault DiagnosisReliability EngineeringEngineeringFault AnalysisComputer Engineering +5

Octave-spanning super-continuum from a silica photonic crystal fiber pumped by a 386 MHz Yb:fiber laser

C. Farrell, K. A. Serrels, Ted Lundquist, +2

Optics Letters

PhotonicsEngineeringPhysicsOptical PropertiesFiber-optic Communication +10

High-resolution subsurface microscopy of CMOS integrated circuits using radially polarized light

Marius Rutkauskas, C. Farrell, C. Dorrer, +4

Optics Letters

High-resolution Subsurface MicroscopyEngineeringMicroscopyIntegrated CircuitsRadial Polarization +19

Quantitative hydrogen depth-profiling using SIMS

Ted Lundquist, R.P. Burgner, P. R. Swann, +1

Applications of Surface Science

EngineeringPhysicsHydrogen TransitionNatural SciencesSpectroscopy +9

Physical IC debug – backside approach and nanoscale challenge

Christian Boit, Rudolf Schlangen, A. Glowacki, +6

Advances in radio science

EngineeringIc FunctionalityIntegrated CircuitsSilicon On InsulatorWafer Scale Processing +16

Practical, non-invasive optical probing for flip-chip devices

G. Dajee, Norman Goldblatt, Ted Lundquist, +2

Optical MaterialsLow JitterEngineeringOptical TestingImage Sensor +15