Concepedia

Publication | Closed Access

Dynamic lock-in thermography for operation mode-dependent thermally active fault localization

DOI

20

Citations

5

References

2010

Year

Rudolf Schlangen, Hervé Deslandes, Ted Lundquist, Christian Schmidt, Frank Altmann, Kai Yu, A. Andreasyan, S. Li
Microelectronics Reliability

References

YearCitations

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