William Lo

New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect

Seema Somani, Steven Kasapi, K. Wilsher et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2001 · 45 citations

Photonic Sensor, Engineering, Hot Electron Effect +25

Laser beam backside probing of CMOS integrated circuits

Steven Kasapi, Chun-Cheng Tsao, Ken Wilsher et al. · Microelectronics Reliability · 1999 · 17 citations

Engineering, Circuit System, Physics +5

Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission

Norman Goldblatt, M. Leibowitz, William Lo · Microelectronics Reliability · 2001 · 15 citations

Photonics, Engineering, Physics +8

Advanced Scan Chain Failure Analysis Using Laser Modulation Mapping and Continuous Wave Probing

Steven Kasapi, William Lo, Joy Liao et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2011 · 15 citations

Reliability Engineering, Engineering, Hardware Reliability +12

Next-Generation Optical Probing Tools for Design Debug of High Speed Integrated Circuits

William Lo, K. Wilsher, Richard Malinsky et al. · Proceedings - International Symposium for Testing and Failure Analysis · 2002 · 14 citations

Photonic Sensor, Engineering, Optical Testing +21