William Lo - Concepedia

Author

William Lo

Nvidia (United States)

Also Known As

W. Lo, William K. Lo, William Lo

Publications

187

Citations

H-Index

Concepts

All Affiliations

Nvidia (United States)Schlumberger (United States)Nvidia (United Kingdom)

About

William Lo is an author at Nvidia (United States) specializing in engineering, applied physics, and instrumentation.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	7	7	130
2	Applied Physics	5	5	103
3	Physics	4	4	91
4	Computer Engineering	3	3	41
5	Electrical Engineering	2	2	57

William Lo

Publications

140

Citations

H-Index

Page 1

	Year	Citations
New photon detector for device analysis: Superconducting single-photon detector based on a hot electron effect Seema Somani, Steven Kasapi, K. Wilsher, Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena Photonic SensorEngineeringHot Electron EffectIntegrated CircuitsNew Photon Detector	2001	45
Laser beam backside probing of CMOS integrated circuits Steven Kasapi, Chun-Cheng Tsao, Ken Wilsher, Microelectronics Reliability EngineeringCircuit SystemPhysicsApplied PhysicsLaser Beam	1999	17
Unique and Practical IC Timing Analysis Tool Utilizing Intrinsic Photon Emission Norman Goldblatt, M. Leibowitz, William Lo Microelectronics Reliability PhotonicsEngineeringPhysicsTiming AnalysisComputer Engineering	2001	15
Advanced Scan Chain Failure Analysis Using Laser Modulation Mapping and Continuous Wave Probing Steven Kasapi, William Lo, Joy Liao, Proceedings - International Symposium for Testing and Failure Analysis Reliability EngineeringEngineeringHardware ReliabilityApplied PhysicsStructural Health Monitoring	2011	15
Next-Generation Optical Probing Tools for Design Debug of High Speed Integrated Circuits William Lo, K. Wilsher, Richard Malinsky, Proceedings - International Symposium for Testing and Failure Analysis Photonic SensorEngineeringOptical TestingIntegrated CircuitsTransient Imaging	2002	14
Comparison of laser voltage probing and mapping results in oversized and minimum size devices of 120 nm and 65 nm technology Ulrike Kindereit, Christian Boit, U. Kerst, Microelectronics Reliability Electrical EngineeringEngineeringMicroscopyScanning Probe MicroscopyApplied Physics	2008	12
Advanced scan chain failure analysis using laser modulation mapping and continuous wave probing Steven Kasapi, William Lo, Joy Liao, Continuous WaveLaser Modulation MappingReliability EngineeringEngineeringHardware Reliability	2012	12
X-Ray Device Alteration Using a Scanning X-Ray Microscope William Lo, Puneet Gupta, Rakshith Venkatesh, Proceedings - International Symposium for Testing and Failure Analysis	2022	10

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