Joy Liao is an author at Nvidia (United States) specializing in engineering, reliability engineering, and failure analysis.
Top concepts
EngineeringInstrumentationFailure AnalysisReliability EngineeringComputer EngineeringStructural Health MonitoringMicroscopyApplied PhysicsMicroelectronicsHigh-power Lasers
Publications per year
2010–2012
4
4
Scan chain failure analysis using laser voltage imaging
Joy Liao, Steven Kasapi, Bruce Cory et al. · Microelectronics Reliability · 2010 · 18 citations
Reliability Engineering, Engineering, Computer Engineering +5
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1–4 of 4