Maxime Gatefait

Hybrid FDSOI/bulk High-k/metal gate platform for low power (LP) multimedia technology

C. Fenouillet-Béranger, P. Perreau, Loan Pham-Nguyen et al. · 2009 · 45 citations

Engineering, Vlsi Design, Electronic Design +17

New mechanism of plasma induced damage on CMOS image sensor: Analysis and process optimization

J.-P. Carrere, J.-P. Oddou, S. Placé et al. · Solid-State Electronics · 2011 · 24 citations

New Mechanism, Process Optimization, Plasma Processing +2

Pattern recognition and data mining techniques to identify factors in wafer processing and control determining overlay error

Auguste Lam, Alexander Ypma, Maxime Gatefait et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2015 · 13 citations

Fault Diagnosis, Wafer Processing, Engineering +17

Toward 7nm target on product overlay for C028 FDSOI technology

Maxime Gatefait, Bertrand Le-Gratiet, P.-J. Goirand et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2013 · 11 citations

3D Ic Architecture, Physical Design (Electronics), Engineering +13

New mechanism of plasma induced damage on CMOS image sensor: Analysis and process optimization

J.-P. Carrere, J.P. Oddou, C. Richard et al. · 2010 · 11 citations

Electrical Engineering, Image Sensor, Cmos Image Sensor +9