S. Mhira

Key parameters driving transistor degradation in advanced strained SiGe channels

Cheikh Ndiaye, M. Arabi, Narendra Parihar et al. · 2018 · 29 citations

Engineering, Electrical Engineering, Materials Science +16

Modeling of Process (Ge, N) Dependence and Mechanical Strain Impact on NBTI in HKMG SiGe GF FDSOI p-MOSFETs and RMG p-FinFETs

Narendra Parihar, Ravi Tiwari, Cheikh Ndiaye et al. · 2018 · 23 citations

Engineering, Electrical Engineering, Materials Science +17

A Path to Energy Efficiency and Reliability for ICs: Fully Depleted Silicon-on-Insulator (FD-SOI) Devices Offer Many Advantages

Bich-Yen Nguyen, Philippe Flatresse, J. Schaeffer et al. · IEEE Solid-State Circuits Magazine · 2018 · 12 citations

Engineering, Computer Engineering, Electrical Engineering +11

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability

A. Benhassain, S. Mhira, F. Cacho et al. · 2016 · 11 citations

Engineering, Computer Engineering, Electrical Engineering +16