Jens-Peter Zöllner

Scanning proximal probes for parallel imaging and lithography

K. Ivanova, Y. Sarov, Tzv. Ivanov et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 2008 · 48 citations

Engineering, Self-actuated Proximal Probes, Microscopy +21

A novel self‐consistent theory of the electronic structure of inversion layers in InSb MIS structures

Jens-Peter Zöllner, H. Übensee, G. Paasch et al. · physica status solidi (b) · 1986 · 31 citations

Categoryquantum Electronics, Engineering, Semiconductor Physics +18

Self‐Consistent Theory of the Electronic Structure of Inversion Layers. I. A New Method Using the Modified Local Density Approximation

H. Übensee, G. Paasch, Jens-Peter Zöllner et al. · physica status solidi (b) · 1985 · 24 citations

Micromachined scanning proximal probes with integrated piezoresistive readout and bimetal actuator for high eigenmode operation

M. Woszczyna, P. Zawierucha, Piotr Pałetko et al. · Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena · 2010 · 22 citations

Engineering, Microscopy, Mechanical Engineering +21

Duo-action electro thermal micro gripper

B. Volland, K. Ivanova, Tzv. Ivanov et al. · Microelectronic Engineering · 2007 · 22 citations

Materials Science, Engineering, Microfabrication +5