Statistics
Publications
12
Citations
392
H-Index
11
Active since
2009
M. Oualli is an author at III V Lab specializing in engineering, applied physics, and electrical engineering.
Publications per year
2009–2019
12
12
Degradation of TiAlNiAu as ohmic contact metal for GaN HEMTs
Michele Piazza, C. Dua, M. Oualli et al. · Microelectronics Reliability · 2009 · 63 citations
Olivier Jardel, Guillaume Callet, Jérémy Dufraisse et al. · International Journal of Microwave and Wireless Technologies · 2011 · 21 citations
Continuous Wave, Wide-bandgap Semiconductor, Electrical Engineering +15
1–5 of 12