Chunlin Liang

An analytical model for self-limiting behavior of hot-carrier degradation in 0.25 mu m n-MOSFET's

Chunlin Liang, Henry T. Gaw, Peng Cheng · IEEE Electron Device Letters · 1992 · 38 citations

Engineering, Electrical Engineering, Microelectronics +16

A study on the physical mechanism in the recovery of gate capacitance to C/sub ox/ in implanted polysilicon MOS structures

S.-W. Lee, Chunlin Liang, C.-S. Pan et al. · IEEE Electron Device Letters · 1992 · 37 citations

Engineering, Electrical Engineering, Microelectronics +16

Scalability of partially depleted SOI technology for sub-0.25 μm logic applications

R. Chau, Reza Arghavani, Morteza S. Alavi et al. · 2002 · 24 citations

Engineering, Computer Engineering, Electrical Engineering +17

AC output conductance of SOI MOSFETs and impact on analog applications

D. Sinitsky, R. Tu, Chunlin Liang et al. · IEEE Electron Device Letters · 1997 · 15 citations

Engineering, Electrical Engineering, Analog Electronics +16