W. R. LaFontaine

An investigation of hardness and adhesion of sputter-deposited aluminum on silicon by utilizing a continuous indentation test

Donald S. Stone, W. R. LaFontaine, P. S. Alexopoulos et al. · Journal of materials research/Pratt's guide to venture capital sources · 1988 · 149 citations

Materials Engineering, Materials Science, Engineering +10

Residual stress measurements of thin aluminum metallizations by continuous indentation and x-ray stress measurement techniques

W. R. LaFontaine, C. A. Paszkiet, M. A. Korhonen et al. · Journal of materials research/Pratt's guide to venture capital sources · 1991 · 99 citations

Materials Science, Engineering, Continuous Indentation +11

Analysis of thermal stress-induced grain boundary cavitation and notching in narrow Al-Si metallizations

Che‐Yu Li, R. D. Black, W. R. LaFontaine · Applied Physics Letters · 1988 · 75 citations

Engineering, Severe Plastic Deformation, Mechanical Engineering +17

Effect of residual stress and adhesion on the hardness of copper films deposited on silicon

W. R. LaFontaine, B. Yost, Che‐Yu Li · Journal of materials research/Pratt's guide to venture capital sources · 1990 · 65 citations

Materials Engineering, Materials Science, Electromigration Technique +13

Stress-induced nucleation of voids in narrow aluminum-based metallizations on silicon substrates

M. A. Korhonen, W. R. LaFontaine, P. Bo rgesen et al. · Journal of Applied Physics · 1991 · 49 citations

Engineering, Severe Plastic Deformation, Cold Working +18