J Haycocks

Traceable calibration of transfer standards for scanning probe microscopy

J Haycocks, Keith Jackson · Precision Engineering · 2004 · 73 citations

Sensor Calibration, Engineering, Microscopy +9

Recent advances in traceable nanoscale dimension and force metrology in the UK

Richard Leach, D.G. Chetwynd, Liam Blunt et al. · Measurement Science and Technology · 2006 · 72 citations

Advances in traceable nanometrology at the National Physical Laboratory^†

Richard Leach, J Haycocks, Keith Jackson et al. · Nanotechnology · 2000 · 63 citations

Nanoparticles, Engineering, Microscopy +25

Comparison on Nanometrology: Nano 2—Step height

Ludger Koenders, R.H. Bergmans, Joergen Garnaes et al. · Metrologia · 2003 · 62 citations

Materials Science, Engineering, Physics +15

Intercomparison of scanning probe microscopes

R Breil, Th. Fries, J Haycocks et al. · Precision Engineering · 2002 · 22 citations

Microscopy, Microscopy Method, Scanning Probe Microscopy +5