R.H. Bergmans

Comparison on Nanometrology: Nano 2—Step height

Ludger Koenders, R.H. Bergmans, Joergen Garnaes et al. · Metrologia · 2003 · 62 citations

Materials Science, Engineering, Physics +15

Virtual CMM using Monte Carlo methods based on frequency content of the error signal

Bas W. van Dorp, Han Haitjema, Frank Delbressine et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2001 · 33 citations

Measurement Theory, Engineering, Measurement +28

Ultra-high precision CMMs and their associated tactile or/and optical scanning probes

H. Nouira, R.H. Bergmans, A. Küng et al. · International Journal of Metrology and Quality Engineering · 2014 · 26 citations · Full text

Engineering, Microscopy, Measurement +30

An Elastically Guided Machine Axis with Nanometer Repeatability

J. K. van Seggelen, P.C.J.N. Rosielle, P.H.J. Schellekens et al. · CIRP Annals · 2005 · 25 citations

Engineering, Soft Robotics, Microfabrication +8

Comparison of asphere measurements by tactile and optical metrological instruments

R.H. Bergmans, H. Nieuwenkamp, Gertjan Kok et al. · Measurement Science and Technology · 2015 · 13 citations

Engineering, Measurement, Optical Testing +22