Emmanuel Collard

Evidence of electrical activity of extended defects in 3C–SiC grown on Si

Xi Song, Jean-François Michaud, F. Cayrel et al. · Applied Physics Letters · 2010 · 65 citations

Engineering, Materials Engineering, Materials Science +17

A simple non-recessed and Au-free high quality Ohmic contacts on AlGaN/GaN: The case of Ti/Al alloy

Georgio El-Zammar, Arnaud Yvon, Wahid Khalfaoui et al. · Materials Science in Semiconductor Processing · 2017 · 22 citations

Engineering, Electrical Engineering, Materials Science +13

Silicon damage and residue overlayer caused by rie and ribe processes with CHF3

Christophe Cardinaud, G. Turban, B. Grolleau et al. · Applied Surface Science · 1989 · 19 citations

Natural Sciences, Materials Engineering, Materials Science +16

Highly selective SiO2/Si reactive ion beam etching withlow energy fluorocarbon ions

Emmanuel Collard, C Lejeune, J.P. Grandchamp et al. · Thin Solid Films · 1990 · 19 citations

Engineering, Materials Engineering, Materials Science +12

Recent Progresses in GaN Power Rectifier

Daniel Alquier, F. Cayrel, Olivier Ménard et al. · Japanese Journal of Applied Physics · 2012 · 16 citations

Engineering, Electrical Engineering, Materials Science +17