Evidence of electrical activity of extended defects in 3C–SiC grown on Si

Xi Song, Jean-François Michaud, F. Cayrel, +5

Applied Physics Letters

Materials EngineeringMaterials ScienceElectrical EngineeringSemiconductorsEngineering +13

Fabrication of ZnO Nanowire Based Piezoelectric Generators and Related Structures

Charles Opoku, Abhishek Singh Dahiya, Christopher Oshman, +4

Physics Procedia

Fabrication of field-effect transistors and functional nanogenerators using hydrothermally grown ZnO nanowires

Charles Opoku, Abhishek Singh Dahiya, F. Cayrel, +3

RSC Advances

EngineeringField-effect TransistorsThermal AnnealingFunctional Piezoelectric NanogeneratorsChemical Engineering +18

Single-crystalline ZnO sheet Source-Gated Transistors

Abhishek Singh Dahiya, Charles Opoku, Radu A. Sporea, +5

Scientific Reports

Fabrication of high performance field-effect transistors and practical Schottky contacts using hydrothermal ZnO nanowires

Charles Opoku, Abhishek Singh Dahiya, Christopher Oshman, +5

Nanotechnology

Controlled growth of 1D and 2D ZnO nanostructures on 4H-SiC using Au catalyst

Abhishek Singh Dahiya, Charles Opoku, Daniel Alquier, +5

Nanoscale Research Letters

EngineeringNanoheterogeneous CatalysisNanostructure GrowthChemical EngineeringNanoelectronics +15

Room light anodic etching of highly doped n-type 4 H-SiC in high-concentration HF electrolytes: Difference between C and Si crystalline faces

Gaël Gautier, F. Cayrel, Marie Capelle, +3

Nanoscale Research Letters

Si FaceEngineeringSilicon On InsulatorSemiconductor DeviceNanoelectronics +14

Zinc oxide sheet field-effect transistors

Abhishek Singh Dahiya, Charles Opoku, Christopher Oshman, +5

Applied Physics Letters

Porosity and thickness characterization of porous Si and oxidized porous Si layers – An ultraviolet–visible–mid infrared ellipsometry study

Bálint Fodor, Emil Agócs, Benjamin Bardet, +6

Microporous and Mesoporous Materials

Materials ScienceSurface CharacterizationThickness CharacterizationEngineeringNanoporous Material +5

A simple non-recessed and Au-free high quality Ohmic contacts on AlGaN/GaN: The case of Ti/Al alloy

Georgio El-Zammar, Arnaud Yvon, Wahid Khalfaoui, +4

Materials Science in Semiconductor Processing

Materials ScienceTi/al AlloyElectrical EngineeringMaterials EngineeringEngineering +5