Yong-Shiuan Tsair

The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications

Wen-Rong Chang, Yean-Kuen Fang, S.F. Ting et al. · IEEE Electron Device Letters · 2003 · 78 citations

Engineering, Electrical Engineering, Materials Science +17

Determination of deep ultrathin equivalent oxide thickness (EOT) from measuring flat-band C-V curve

Chang‐Hsiao Chen, Y.K. Fang, Ching-Fen Yang et al. · IEEE Transactions on Electron Devices · 2002 · 26 citations

Engineering, Materials Engineering, Materials Science +17

Thermally-enhanced remote plasma nitrided ultrathin (1.65 nm) gate oxide with excellent performances in reduction of leakage current and boron diffusion

Chang‐Hsiao Chen, Y.K. Fang, Chih-Wei Yang et al. · IEEE Electron Device Letters · 2001 · 22 citations

Engineering, Electrical Engineering, Materials Science +17

A high breakdown-voltage SiCN/Si heterojunction diode for high-temperature applications

S.F. Ting, Yean-Kuen Fang, Wen-Tse Hsieh et al. · IEEE Electron Device Letters · 2002 · 16 citations

Engineering, Electrical Engineering, Materials Science +17

High-quality ultrathin (1.6 nm) nitride/oxide stack gate dielectrics prepared by combining remote plasma nitridation and LPCVD technologies

Chang‐Hsiao Chen, Y.K. Fang, Chih-Wei Yang et al. · IEEE Electron Device Letters · 2001 · 13 citations

Engineering, Materials Engineering, Materials Science +17