S.F. Ting

The hetero-epitaxial SiCN/Si MSM photodetector for high-temperature deep-UV detecting applications

Wen-Rong Chang, Yean-Kuen Fang, S.F. Ting et al. · IEEE Electron Device Letters · 2003 · 76 citations

Materials Science, Photonics, Electrical Engineering +15

Effects of surface porosity on tungsten trioxide(WO3) films’ electrochromic performance

W. J. Lee, Yu Fang, Jyh‐Jier Ho et al. · Journal of Electronic Materials · 2000 · 65 citations

Materials Science, Materials Engineering, Engineering +9

Downscaling limit of equivalent oxide thickness in formation of ultrathin gate dielectric by thermal-enhanced remote plasma nitridation

Chien-Hao Chen, Yean-Kuen Fang, S.F. Ting et al. · IEEE Transactions on Electron Devices · 2002 · 40 citations

Materials Science, Materials Engineering, Electrical Engineering +11

The effect of remote plasma nitridation on the integrity of the ultrathin gate dielectric films in 0.13 μm CMOS technology and beyond

S.F. Ting, Y.K. Fang, Chang‐Hsiao Chen et al. · IEEE Electron Device Letters · 2001 · 27 citations

Materials Engineering, Experimental Results, Electrical Engineering +14

Determination of deep ultrathin equivalent oxide thickness (EOT) from measuring flat-band C-V curve

Chang‐Hsiao Chen, Y.K. Fang, Ching-Fen Yang et al. · IEEE Transactions on Electron Devices · 2002 · 26 citations

Materials Science, Materials Engineering, Electrical Engineering +14