Usama Zaghloul

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation

Mohamed Lamhamdi, P. Pons, Usama Zaghloul et al. · Microelectronics Reliability · 2008 · 71 citations

Engineering, Electrical Engineering, Materials Science +14

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions

Usama Zaghloul, G. Papaioannou, Fabio Coccetti et al. · Microelectronics Reliability · 2009 · 69 citations

Engineering, Materials Engineering, Materials Science +17

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies

Usama Zaghloul, G. Papaioannou, Bharat Bhushan et al. · Microelectronics Reliability · 2011 · 66 citations

Engineering, Electrical Engineering, Materials Science +17

On the influence of environment gases, relative humidity and gas purification on dielectric charging/discharging processes in electrostatically driven MEMS/NEMS devices

Usama Zaghloul, Bharat Bhushan, P. Pons et al. · Nanotechnology · 2010 · 53 citations

Natural Sciences, Electrical Engineering, Materials Science +17

Sub-1-volt Piezoelectric Nanoelectromechanical Relays With Millivolt Switching Capability

Usama Zaghloul, Gianluca Piazza · IEEE Electron Device Letters · 2014 · 45 citations

Engineering, Electrical Engineering, Materials Science +17