P. Pons

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation

Mohamed Lamhamdi, P. Pons, Usama Zaghloul et al. · Microelectronics Reliability · 2008 · 71 citations

Electrical Engineering, Dielectrics, Engineering +7

Dielectric charging in silicon nitride films for MEMS capacitive switches: Effect of film thickness and deposition conditions

Usama Zaghloul, G. Papaioannou, Fabio Coccetti et al. · Microelectronics Reliability · 2009 · 68 citations

Materials Science, Electrical Engineering, Engineering +11

On the reliability of electrostatic NEMS/MEMS devices: Review of present knowledge on the dielectric charging and stiction failure mechanisms and novel characterization methodologies

Usama Zaghloul, G. Papaioannou, Bharat Bhushan et al. · Microelectronics Reliability · 2011 · 65 citations

Electrical Engineering, Engineering, Hardware Reliability +12

Novel Design of a Highly Sensitive RF Strain Transducer for Passive and Remote Sensing in Two Dimensions

Trang Thai, H. Aubert, P. Pons et al. · IEEE Transactions on Microwave Theory and Techniques · 2013 · 64 citations

Engineering, Radio Frequency, Mechanical Engineering +18

Capabilities and limits of silicon pressure sensors

G. Blazquez, P. Pons, Ali Boukabache · Sensors and Actuators · 1989 · 59 citations

Electrical Engineering, Engineering, Sensors +5