Concepedia

Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation

Mohamed Lamhamdi, P. Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, G. Papaioannou, R. Plana

Microelectronics Reliability · 2008 · 71 citations · 14 references

DOI

Concepts

References

14

Temperature study of the dielectric polarization effects of capacitive RF MEMS switches

G. Papaioannou, M.-N. Exarchos, V. Theonas et al. · IEEE Transactions on Microwave Theory and Techniques · 2005 · 119 citations

, , +17

Distributed dielectric charging and its impact on RF MEMS devices

Xavier Rottenberg, Bart Nauwelaers, W. De Raedt et al. · AMS Acta (University of Bologna) · 2004 · 84 citations · Full text

, , +17

Relaxation to Equilibrium in the Random Energy Model

Eugene I. Shakhnovich, A. M. Gutin · Europhysics Letters (EPL) · 1989 · 59 citations

, , +16

Structure dependent charging process in RF MEMS capacitive switches

E. Papandreou, Mohamed Lamhamdi, C.M. Skoulikidou et al. · Microelectronics Reliability · 2007 · 54 citations

, , +11

Charging-Effects in RF capacitive switches influence of insulating layers composition

Mohamed Lamhamdi, J. Guastavino, Laurent Boudou et al. · Microelectronics Reliability · 2006 · 54 citations

, , +14