Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation - Concepedia

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Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation

71

Citations

14

References

2008

Year

Mohamed Lamhamdi, P. Pons, Usama Zaghloul, Laurent Boudou, Fabio Coccetti, J. Guastavino, Y. Segui, G. Papaioannou, R. Plana

Microelectronics Reliability

Electrical EngineeringDielectricsEngineeringTime-dependent Dielectric BreakdownTemperature EffectCircuit ReliabilityDevice ReliabilityMicroelectronicsElectrical PropertyElectrical Insulation

References

	Year	Citations

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