Concepedia

Peter Speckbacher

PS

Statistics

Publications

3

Citations

85

H-Index

3

Active since

1990

Affiliations

Heidenhain (Germany)(Current)

Technical University of Munich

Siemens (Germany)

Peter Speckbacher is an author at Heidenhain (Germany) specializing in engineering, semiconductor devices, and interface defects.

Publications per year

1990–2005

3

Publications

3

The "gated-diode" configuration in MOSFET's, a sensitive tool for characterizing hot-carrier degradation

Peter Speckbacher, Johannes Berger, A. Asenov et al. · IEEE Transactions on Electron Devices · 1995 · 48 citations

, , +17

Hot-carrier-induced deep-level defects from gated-diode measurements on MOSFETs

Peter Speckbacher, A. Asenov, M. Bollu et al. · IEEE Electron Device Letters · 1990 · 25 citations

, , +16

Results of a round robin measurement on a new CD mask standard

Fritz Gans, Roman Liebe, Jan Richter et al. · Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE · 2005 · 12 citations

, , +16

1–3 of 3