M. Bollu

Unified complete MOSFET model for analysis of digital and analog circuits

M. Miura–Mattausch, Uwe Feldmann, A. Rahm et al. · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1996 · 132 citations

Engineering, Electrical Engineering, Circuit Theory +16

Hot-carrier-induced deep-level defects from gated-diode measurements on MOSFETs

Peter Speckbacher, A. Asenov, M. Bollu et al. · IEEE Electron Device Letters · 1990 · 25 citations

Engineering, Electrical Engineering, Microelectronics +16

Electrical switching and noise spectrum of Si-SiO2 interface defects generated by hot electrons

M. Bollu, F. Koch, A. J. Madenach et al. · Applied Surface Science · 1987 · 18 citations

Engineering, Materials Engineering, Materials Science +17

ROS: an extremely high density mask ROM technology based on vertical transistor cells

E. Bertagnolli, F. Hofmann, J. Willer et al. · 2002 · 14 citations

Engineering, Computer Engineering, Electrical Engineering +16

Hot-carrier degradation monitoring in LDD n-MOSFETs using drain gated-diode measurements

A. Asenov, Johannes Berger, W. Weber et al. · Microelectronic Engineering · 1991 · 13 citations

Engineering, Electrical Engineering, Microelectronics +13